
AXUV (Absolute XUV) series devices feature a 6nm oxide window and 100% internal QE. They can be used for high performance measurement of photons, electrons or x-rays from 0.0124nm to 190nm and detect energy from 100eV to 50keV with a remarkable 100% internal quantum efficiency.
ODC's AXUV-Series are recommended for detection of low energy electrons and ions in applications such as BackScatter and Secondary Electron detectors in Scanning Electron Microscopes.
Due to their unparalleled quantum efficiency stability and radiation hardness IRD photodiodes have been successfully used in a number of ESA & NASA solar space instrumentation programmes.
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Part Number |
Active Area |
RSh |
ID @50V |
C @0V |
Risetime 10-90% |
AXUV High Speed Detectors |
 |
AXUV-Series technology overview and data sheets |
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AXUV20HS1 |
5.01mm dia. 19.7mm² |
- |
100pA |
200nF |
2ns @ 150V |
 |
AXUV63HS1 |
9.0mm dia., 63mm² |
- |
100pA |
10nF |
2ns @ 150V |
 |
AXUV63HS1-CH |
9.0mm Ø, 63mm², 1mm Ø hole |
- |
100pA |
10nF |
2ns @ 150V |
AXUV - Absolute Devices/Transfer Standards
|
 |
AXUV20A |
5.5mm dia., 23mm² |
100MΩ |
- |
10nF |
2µs |
 |
AXUV100G |
10x10mm², 100mm² |
20MΩ |
- |
10nF |
10µs |
 |
AXUV300C |
21.56x15.36mm², 331mm² |
20MΩ |
- |
25nF |
15µs |
 |
AXUV576C |
24.01x24.01mm², 576.5mm² |
50MΩ |
- |
120nF |
- |
AXUV Multielement Arrays |
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AXUV16ELG |
16 pixels, 2x5mm, 10mm² |
100MΩ |
- |
40nF |
500µs |
 |
AXUV20ELG |
20 pixels, 0.75x4.1mm, 3mm² |
300MΩ |
- |
40nF |
200µs |
 |
AXUVPS7 |
Circular Quadrant with Hole 15.4mm dia., 5.6mm hole |
200MΩ |
- |
1.5nF |
2000µs |
AXUV Filtered Detectors |
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AXUV100TF030 |
100mm², 1-12nm, 0.16A/W @ 3nm |
20MΩ |
- |
10nF |
- |
 |
AXUV100TF400 |
100mm², 18-80nm, 0.15A/W @ 40nm |
20MΩ |
- |
10nF |
250µs |
Sockets
|
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AXUV20ACS |
Ceramic socket; AXUV20A, AXUV20HS1, 2-pin, 7.4mm spacing |
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AXUV100CS |
Ceramic socket; AXUV100-Series, 2-pin, 12.5mm spacing |
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AXUV16ELCS |
Ceramic socket; AXUV16ELG, 2x20-pin, 2.54x15mm spacing |
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AXUV20ELCS |
Ceramic socket; AXUV20ELG, 2x11-pin, 2.54x10.15mm spacing |